Ion-tof公司

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Time-of-Flight Secondary Ion Mass Spectrometry NIST

WebAn ion source (either pulsed or continuous) is used for lab-related TOF experiments, but not needed for TOF analyzers used in space, where the sun or planetary ionospheres … Web刘看山 知乎指南 知乎协议 知乎隐私保护指引 应用 工作 申请开通知乎机构号 侵权举报 网上有害信息举报专区 京 icp 证 110745 号 京 icp 备 13052560 号 - 1 京公网安备 … how are rights promoted in health and social https://oianko.com

IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ...

WebTime-of-Flight Secondary Ion Mass Spectrometry, or TOF-SIMS, works by rastering a pulsed beam of focused primary ions across the area of interest, resulting in the emission of secondary ions which are characteristic of the materials present in the top several monolayers of the sample.By accurately measuring the masses of the detected ions they … Web29 mrt. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering … The M6 Plus - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... SurfaceLab 7 - IONTOF - TOF-SIMS (time of flight secondary ion mass … The basic instrument is equipped with a reflectron TOF analyser giving high … Low Energy Ion Scattering - IONTOF - TOF-SIMS (time of flight secondary ion … With the Q Exactive TM extension for the M6, IONTOF provides the first … Service - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Sales - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Applications - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... http://www.iontof.com.cn/ how many miles in a 12k

关于我们-飞行时间二次离子质谱 (TOF-SIMS) 德国IONTOF

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Ion-tof公司

北京艾飞拓科技有限公司__首页 - Instrument

Web22 dec. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis http://www.iontof.com.cn/bk_16938892.html

Ion-tof公司

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Web德国ion tof公司是目前国际tof-sims仪器主要生产商。 2003年，德国ion tof公司研发了第五代tof-sims仪器。 2005年，德国ion tof公司推出第一代bi源。 2010年，德国ion tof公司 … Web25 mei 2024 · IONTOF GmbH 626 followers on LinkedIn. Advanced Ion Beam Technology for Surface Analysis. Innovative Ion Beam Technology for Surface Analysis IONTOF is a manufacturer of innovative instruments ...

WebThe TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF Company. Its design guarantees optimum performance in all fields of SIMS applications. The instruments offers three ion sources offering Bi1–7+, Cs+ and O2+ and is equipped with a reflectron TOF analyzer giving high secondary ion transmission with ... WebThe ioniTOF mass analyzer is designed as a modular and flexible TOF-MS platform that allows you to choose the mass resolving power you need and also upgrade to higher resolution if you feel the need at a later stage of your experiments. The ioniTOF is available with mass resolutions ranging from 500 to even more than 10,000.

WebIONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry) - LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, … WebUltra-high transmission for optimized molecular sensitivity and monolayer analysis High speed (> 8 kHz) TOF-SIMS (MS 1) and tandem MS (MS 2) imaging High resolution (< 100 nm) TOF-SIMS (MS 1) and tandem MS …

Web24 mrt. 2024 · Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrices. Commonly, the …

Web3 jul. 2012 · 北京艾飞拓科技有限公司作为德国ION-TOF公司的中国总代理，成立于2012年。. 公司成员来自北京大学、中科院物理所等一流院校研究生。. 主要负责中国大陆及港澳地区的销售、售后、宣传、技术培训等工作。. “以物理学、材料学、国际贸易等专业背景打造的 ... how many miles in a 30kWebZ-Gap MCP Microchannel Plate Detectors are available with 18mm, 25mm or 40mm Microchannel Plates. Note: Z-Gap detectors cannot be used to detect negative ions or electrons. Jordan TOF Products, Inc. 990 Golden Gate Terrace Grass Valley, CA 95945 Phone: 530-272-4580 E-mail: [email protected] how many miles in a 3k runWebIONTOF GmbH 622 volgers op LinkedIn. Advanced Ion Beam Technology for Surface Analysis. Innovative Ion Beam Technology for Surface Analysis IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometers (TOF-SIMS) and high-sensitivity low-energy ion … how many miles in a 10k racehttp://rmjordan.com/ how are rights protected in australiaWebIONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... how are rights and responsibilities connectedWebAbout IONTOF GmbH: IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry … how many miles in a degree latitudeWebToF-SIMS is an imaging mass spectrometry (MS) technique that allows us to obtain isotopic, elemental, and molecular information from the surface of solid samples. A pulsed, … how many miles in a kil